Han Yu, Shuting Yang, Steven X. Ding, Zhongcheng Dai, Shen Yin. A Data-Driven Fault Detection Scheme for Complex Industrial Systems Using Riemannian Metric and Randomized Algorithms. In 29th IEEE International Symposium on Industrial Electronics, ISIE 2020, Delft, The Netherlands, June 17-19, 2020. pages 1193-1198, IEEE, 2020. [doi]
@inproceedings{YuYDDY20, title = {A Data-Driven Fault Detection Scheme for Complex Industrial Systems Using Riemannian Metric and Randomized Algorithms}, author = {Han Yu and Shuting Yang and Steven X. Ding and Zhongcheng Dai and Shen Yin}, year = {2020}, doi = {10.1109/ISIE45063.2020.9152552}, url = {https://doi.org/10.1109/ISIE45063.2020.9152552}, researchr = {https://researchr.org/publication/YuYDDY20}, cites = {0}, citedby = {0}, pages = {1193-1198}, booktitle = {29th IEEE International Symposium on Industrial Electronics, ISIE 2020, Delft, The Netherlands, June 17-19, 2020}, publisher = {IEEE}, isbn = {978-1-7281-5635-4}, }