Han Yu, Shuting Yang, Steven X. Ding, Zhongcheng Dai, Shen Yin. A Data-Driven Fault Detection Scheme for Complex Industrial Systems Using Riemannian Metric and Randomized Algorithms. In 29th IEEE International Symposium on Industrial Electronics, ISIE 2020, Delft, The Netherlands, June 17-19, 2020. pages 1193-1198, IEEE, 2020. [doi]
Abstract is missing.