Jie Yu, Xuehai Zhou. A new reliability evaluation method for embedded system. In Qiang Wu, Xiangjian He, Quang Vinh Nguyen, Wenjing Jia, Mao Lin Huang, editors, Proceedings of 8th IEEE International Conference on Computer and Information Technology, CIT 2008, Sydney, Australia, July 8-11, 2008. pages 224-230, IEEE, 2008. [doi]
@inproceedings{YuZ08-2,
title = {A new reliability evaluation method for embedded system},
author = {Jie Yu and Xuehai Zhou},
year = {2008},
doi = {10.1109/CIT.2008.4594678},
url = {http://dx.doi.org/10.1109/CIT.2008.4594678},
researchr = {https://researchr.org/publication/YuZ08-2},
cites = {0},
citedby = {0},
pages = {224-230},
booktitle = {Proceedings of 8th IEEE International Conference on Computer and Information Technology, CIT 2008, Sydney, Australia, July 8-11, 2008},
editor = {Qiang Wu and Xiangjian He and Quang Vinh Nguyen and Wenjing Jia and Mao Lin Huang},
publisher = {IEEE},
isbn = {978-1-4244-2357-6},
}