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Auxiliary Information Flow for 3D Industrial Defect Detection on IC Ceramic Package Substrate Surfaces: Dataset and Benchmark

Ruiyun Yu, Ziming Zhao 0017, Shi Zhen. Auxiliary Information Flow for 3D Industrial Defect Detection on IC Ceramic Package Substrate Surfaces: Dataset and Benchmark. IEEE Trans. Circuits Syst. Video Techn., 36(6):7444-7456, June 2026. [doi]

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