Signal-To-Noise Ratio: A Robust Distance Metric for Deep Metric Learning - researchr publication authors

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Tongtong Yuan, Weihong Deng, Jian Tang, Yinan Tang, Binghui Chen. Signal-To-Noise Ratio: A Robust Distance Metric for Deep Metric Learning. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2019, Long Beach, CA, USA, June 16-20, 2019. pages 4815-4824, Computer Vision Foundation / IEEE, 2019. [doi]

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