Signal-To-Noise Ratio: A Robust Distance Metric for Deep Metric Learning

Tongtong Yuan, Weihong Deng, Jian Tang, Yinan Tang, Binghui Chen. Signal-To-Noise Ratio: A Robust Distance Metric for Deep Metric Learning. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2019, Long Beach, CA, USA, June 16-20, 2019. pages 4815-4824, Computer Vision Foundation / IEEE, 2019. [doi]

@inproceedings{YuanDTTC19,
  title = {Signal-To-Noise Ratio: A Robust Distance Metric for Deep Metric Learning},
  author = {Tongtong Yuan and Weihong Deng and Jian Tang and Yinan Tang and Binghui Chen},
  year = {2019},
  url = {http://openaccess.thecvf.com/content_CVPR_2019/html/Yuan_Signal-To-Noise_Ratio_A_Robust_Distance_Metric_for_Deep_Metric_Learning_CVPR_2019_paper.html},
  researchr = {https://researchr.org/publication/YuanDTTC19},
  cites = {0},
  citedby = {0},
  pages = {4815-4824},
  booktitle = {IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2019, Long Beach, CA, USA, June 16-20, 2019},
  publisher = {Computer Vision Foundation / IEEE},
}