28nm Fault-Tolerant Hardening-by-Design Frequency Divider for Reducing Soft Errors in Clock and Data Recovery

Hengzhou Yuan, Yang Guo, Jianjun Chen, Yaqing Chi, Xi Chen, Bin Liang. 28nm Fault-Tolerant Hardening-by-Design Frequency Divider for Reducing Soft Errors in Clock and Data Recovery. IEEE Access, 7:47955-47961, 2019. [doi]

Abstract

Abstract is missing.