J. S. Yuan, E. Kritchanchai. Power amplifier resilient design for process, voltage, and temperature variations. Microelectronics Reliability, 53(6):856-860, 2013. [doi]
@article{YuanK13,
title = {Power amplifier resilient design for process, voltage, and temperature variations},
author = {J. S. Yuan and E. Kritchanchai},
year = {2013},
doi = {10.1016/j.microrel.2013.02.003},
url = {http://dx.doi.org/10.1016/j.microrel.2013.02.003},
researchr = {https://researchr.org/publication/YuanK13},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {53},
number = {6},
pages = {856-860},
}