J. S. Yuan - researchr alias

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Viewing Publication 1 - 27 from 27

2014

Power amplifier resilient design for process and temperature variations using an on-chip PLL sensing signalJ. S. Yuan, S. Chen. mr, 54(1):167-171, 2014. [doi]

2013

2012

RF stress effects on CMOS LC-loaded VCO reliability evaluated by experimentsH. D. Yen, J. S. Yuan, R. L. Wang, G. W. Huang, W. K. Yeh, F. S. Huang. mr, 52(11):2655-2659, 2012. [doi]

2010

Impact of strain on hot electron reliability of dual-band power amplifier and integrated LNA-mixer RF performancesJ. S. Yuan, J. Ma, W. K. Yeh, C. W. Hsu. mr, 50(6):807-812, 2010. [doi]

Voltage stress effect on class AB power amplifier and mixed-signal sample-hold circuitJ. S. Yuan, J. Ma. mr, 50(6):801-806, 2010. [doi]

2008

PMOS breakdown effects on digital circuits - Modeling and analysisWeidong Kuang, Lizhi Cao, C. Yu, J. S. Yuan. mr, 48(8-9):1597-1600, 2008. [doi]

2006

Dynamic voltage stress effects on nMOS varactorChuanzhao Yu, J. S. Yuan, Enjun Xiao. mr, 46(9-11):1812-1816, 2006. [doi]

Study of performance degradations in DC-DC converter due to hot carrier stress by simulationC. Yu, L. Jiang, J. S. Yuan. mr, 46(9-11):1840-1843, 2006. [doi]

2005

Low-power CMOS wireless MEMS motion sensor for physiological activity monitoringAnwar Sadat, Hongwei Qu, Chuanzhao Yu, J. S. Yuan, Huikai Xie. tcas, 52-I(12):2539-2551, 2005. [doi]

Hot carrier and soft breakdown effects on LNA performance for ultra wideband communicationsEnjun Xiao, P. P. Ghosh, C. Yu, J. S. Yuan. mr, 45(9-11):1382-1385, 2005. [doi]

Voltage stress-induced hot carrier effects on SiGe HBT VCOChuanzhao Yu, Enjun Xiao, J. S. Yuan. mr, 45(9-11):1402-1405, 2005. [doi]

Dynamic stress-induced high-frequency noise degradations in nMOSFETsChuanzhao Yu, J. S. Yuan, Anwar Sadat. mr, 45(9-11):1794-1799, 2005. [doi]

Voltage stress-induced performance degradation in NMOSFET mixerChuanzhao Yu, Hong Yang, Enjun Xiao, J. S. Yuan. ieiceee, 2(5):133-137, 2005. [doi]

Teaching digital noise and noise margin issues in engineering educationJ. S. Yuan, Li Yang. te, 48(1):162-168, 2005. [doi]

2003

2002

Modeling the output waveform of CMOS gate with feedback effectLi Yang, J. S. Yuan, M. Hagedorn. icecsys 2002: 1127-1130 [doi]

2001

Hot-carrier-Induced Circuit Degradation for 0.18 ?m CMOS TechnologyWei Li, Qiang Li, J. S. Yuan, Joshua McConkey, Yuan Chen, Sundar Chetlur, Jonathan Zhou, A. S. Oates. isqed 2001: 284-289 [doi]

1996

Scalable bipolar model for BiCMOS and bipolar circuitsY. Dai, J. S. Yuan, A. M. Phanse, C.-S. Yeh, K. Kwang. icecsys 1996: 868-871 [doi]

Effects of Ge profiles on base transit time and base resistance of SiGe HBT'sJ. Song, J. S. Yuan, F. Schwierz, D. Schipanski. icecsys 1996: 876-879 [doi]

1988

Closed-loop manipulator control using quaternion feedbackJ. S. Yuan. trob, 4(4):434-440, 1988. [doi]

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