J. S. Yuan, J. Ma. Voltage stress effect on class AB power amplifier and mixed-signal sample-hold circuit. Microelectronics Reliability, 50(6):801-806, 2010. [doi]
@article{YuanM10-0,
title = {Voltage stress effect on class AB power amplifier and mixed-signal sample-hold circuit},
author = {J. S. Yuan and J. Ma},
year = {2010},
doi = {10.1016/j.microrel.2010.02.009},
url = {http://dx.doi.org/10.1016/j.microrel.2010.02.009},
researchr = {https://researchr.org/publication/YuanM10-0},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {6},
pages = {801-806},
}