Standard cell library characterization for FinFET transistors using BSIM-CMG models - researchr publication authors

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Yu Yuan, Cecilia García Martin, Erdal Oruklu. Standard cell library characterization for FinFET transistors using BSIM-CMG models. In IEEE International Conference on Electro/Information Technology, EIT 2015, Dekalb, IL, USA, May 21-23, 2015. pages 494-498, IEEE, 2015. [doi]

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