Yu Yuan, Cecilia García Martin, Erdal Oruklu. Standard cell library characterization for FinFET transistors using BSIM-CMG models. In IEEE International Conference on Electro/Information Technology, EIT 2015, Dekalb, IL, USA, May 21-23, 2015. pages 494-498, IEEE, 2015. [doi]
@inproceedings{YuanMO15,
title = {Standard cell library characterization for FinFET transistors using BSIM-CMG models},
author = {Yu Yuan and Cecilia García Martin and Erdal Oruklu},
year = {2015},
doi = {10.1109/EIT.2015.7293388},
url = {http://dx.doi.org/10.1109/EIT.2015.7293388},
researchr = {https://researchr.org/publication/YuanMO15},
cites = {0},
citedby = {0},
pages = {494-498},
booktitle = {IEEE International Conference on Electro/Information Technology, EIT 2015, Dekalb, IL, USA, May 21-23, 2015},
publisher = {IEEE},
isbn = {978-1-4799-8802-0},
}