A resistance matching based self-testable current-mode R-2R digital-to-analog converter

Jun Yuan, Masayoshi Tachibana. A resistance matching based self-testable current-mode R-2R digital-to-analog converter. IEICE Electronic Express, 10(23):20130753, 2013. [doi]

@article{YuanT13,
  title = {A resistance matching based self-testable current-mode R-2R digital-to-analog converter},
  author = {Jun Yuan and Masayoshi Tachibana},
  year = {2013},
  doi = {10.1587/elex.10.20130753},
  url = {http://dx.doi.org/10.1587/elex.10.20130753},
  researchr = {https://researchr.org/publication/YuanT13},
  cites = {0},
  citedby = {0},
  journal = {IEICE Electronic Express},
  volume = {10},
  number = {23},
  pages = {20130753},
}