Measuring Hidden Bias within Face Recognition via Racial Phenotypes

Seyma Yucer, Furkan Tektas, Noura Al Moubayed, Toby P. Breckon. Measuring Hidden Bias within Face Recognition via Racial Phenotypes. In IEEE/CVF Winter Conference on Applications of Computer Vision, WACV 2022, Waikoloa, HI, USA, January 3-8, 2022. pages 3202-3211, IEEE, 2022. [doi]

Authors

Seyma Yucer

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Furkan Tektas

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Noura Al Moubayed

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Toby P. Breckon

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