Measuring Hidden Bias within Face Recognition via Racial Phenotypes

Seyma Yucer, Furkan Tektas, Noura Al Moubayed, Toby P. Breckon. Measuring Hidden Bias within Face Recognition via Racial Phenotypes. In IEEE/CVF Winter Conference on Applications of Computer Vision, WACV 2022, Waikoloa, HI, USA, January 3-8, 2022. pages 3202-3211, IEEE, 2022. [doi]

@inproceedings{YucerTMB22,
  title = {Measuring Hidden Bias within Face Recognition via Racial Phenotypes},
  author = {Seyma Yucer and Furkan Tektas and Noura Al Moubayed and Toby P. Breckon},
  year = {2022},
  doi = {10.1109/WACV51458.2022.00326},
  url = {https://doi.org/10.1109/WACV51458.2022.00326},
  researchr = {https://researchr.org/publication/YucerTMB22},
  cites = {0},
  citedby = {0},
  pages = {3202-3211},
  booktitle = {IEEE/CVF Winter Conference on Applications of Computer Vision, WACV 2022, Waikoloa, HI, USA, January 3-8, 2022},
  publisher = {IEEE},
  isbn = {978-1-6654-0915-5},
}