Han Yue, Rucen Wang, Yi Gao, Ailing Xia, Jianhua Zhang. DSP-Based Industrial Defect Detection for Intelligent Manufacturing. In Weiming Shen 0001, Jean-Paul A. Barthès, Junzhou Luo, Adriana S. Vivacqua, Daniel Schneider 0008, Cheng Xie, Jinghui Zhang, Haibin Zhu, Kunkun Peng, Claudia Lage Rebello da Motta, editors, 26th International Conference on Computer Supported Cooperative Work in Design, CSCWD 2023, Rio de Janeiro, Brazil, May 24-26, 2023. pages 1667-1672, IEEE, 2023. [doi]
@inproceedings{YueWGXZ23,
title = {DSP-Based Industrial Defect Detection for Intelligent Manufacturing},
author = {Han Yue and Rucen Wang and Yi Gao and Ailing Xia and Jianhua Zhang},
year = {2023},
doi = {10.1109/CSCWD57460.2023.10152825},
url = {https://doi.org/10.1109/CSCWD57460.2023.10152825},
researchr = {https://researchr.org/publication/YueWGXZ23},
cites = {0},
citedby = {0},
pages = {1667-1672},
booktitle = {26th International Conference on Computer Supported Cooperative Work in Design, CSCWD 2023, Rio de Janeiro, Brazil, May 24-26, 2023},
editor = {Weiming Shen 0001 and Jean-Paul A. Barthès and Junzhou Luo and Adriana S. Vivacqua and Daniel Schneider 0008 and Cheng Xie and Jinghui Zhang and Haibin Zhu and Kunkun Peng and Claudia Lage Rebello da Motta},
publisher = {IEEE},
isbn = {979-8-3503-3168-4},
}