Han Yue, Rucen Wang, Yi Gao, Ailing Xia, Jianhua Zhang. DSP-Based Industrial Defect Detection for Intelligent Manufacturing. In Weiming Shen 0001, Jean-Paul A. Barthès, Junzhou Luo, Adriana S. Vivacqua, Daniel Schneider 0008, Cheng Xie, Jinghui Zhang, Haibin Zhu, Kunkun Peng, Claudia Lage Rebello da Motta, editors, 26th International Conference on Computer Supported Cooperative Work in Design, CSCWD 2023, Rio de Janeiro, Brazil, May 24-26, 2023. pages 1667-1672, IEEE, 2023. [doi]
Abstract is missing.