Alan L. Yuille, James M. Coughlan, Song Chun Zhu, Ying Nian Wu. Order Parameters for Minimax Entropy Distributions: When Does High Level Knowledge Help?. In 2000 Conference on Computer Vision and Pattern Recognition (CVPR 2000), 13-15 June 2000, Hilton Head, SC, USA. pages 1558-1565, IEEE Computer Society, 2000. [doi]
Abstract is missing.