Tsuyoshi Yumoto, Tohru Matsuodani, Kazuhiko Tsuda. A study on an approach for analysing test basis using I/O test data patterns. In Eighth IEEE International Conference on Software Testing, Verification and Validation, ICST 2015 Workshops, Graz, Austria, April 13-17, 2015. pages 1-8, IEEE Computer Society, 2015. [doi]
Abstract is missing.