Hyojoon Yun, Tae-Hyun Kim, Sungho Kang. Machine Learning based Scan Chain Diagnosis for Double Faults. In 20th International SoC Design Conference, ISOCC 2023, Jeju, Republic of Korea, October 25-28, 2023. pages 341-342, IEEE, 2023. [doi]
@inproceedings{YunKK23-3,
title = {Machine Learning based Scan Chain Diagnosis for Double Faults},
author = {Hyojoon Yun and Tae-Hyun Kim and Sungho Kang},
year = {2023},
doi = {10.1109/ISOCC59558.2023.10396107},
url = {https://doi.org/10.1109/ISOCC59558.2023.10396107},
researchr = {https://researchr.org/publication/YunKK23-3},
cites = {0},
citedby = {0},
pages = {341-342},
booktitle = {20th International SoC Design Conference, ISOCC 2023, Jeju, Republic of Korea, October 25-28, 2023},
publisher = {IEEE},
isbn = {979-8-3503-2703-8},
}