Hot electron induced punchthrough voltage of p-channel SOI MOSFET s at room and elevated temperatures

Se Re Na Yun, Won Sub Park, Byung Ha Lee, Jong-Tae Park. Hot electron induced punchthrough voltage of p-channel SOI MOSFET s at room and elevated temperatures. Microelectronics Reliability, 43(9-11):1477-1482, 2003. [doi]

Abstract

Abstract is missing.