Onur Yuzugullu, Stefano Marelli, Esra Erten, Bruno Sudret, Irena Hajnsek. Global sensitivity analysis of a morphology based electromagnetic scattering model. In 2015 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2015, Milan, Italy, July 26-31, 2015. pages 2743-2746, IEEE, 2015. [doi]
Abstract is missing.