Morteza Zahedi, Daniel Keysers, Thomas Deselaers, Hermann Ney. Combination of Tangent Distance and an Image Distortion Model for Appearance-Based Sign Language Recognition. In Walter G. Kropatsch, Robert Sablatnig, Allan Hanbury, editors, Pattern Recognition, 27th DAGM Symposium, Vienna, Austria, August 31 - September 2, 2005, Proceedings. Volume 3663 of Lecture Notes in Computer Science, pages 401-408, Springer, 2005. [doi]
Abstract is missing.