Ranking Loss: Maximizing the Success Rate in Deep Learning Side-Channel Analysis

Gabriel Zaid, Lilian Bossuet, François Dassance, Amaury Habrard, Alexandre Venelli. Ranking Loss: Maximizing the Success Rate in Deep Learning Side-Channel Analysis. IACR Cryptology ePrint Archive, 2020:872, 2020. [doi]

Abstract

Abstract is missing.