A High-Precision Particle Detection ROIC With an Active Shaper in 40 nm CMOS with Sub 200 aC Sensitivity - researchr publication

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Alireza Mohammad Zaki, Stoyan Nihtianov. A High-Precision Particle Detection ROIC With an Active Shaper in 40 nm CMOS with Sub 200 aC Sensitivity. In 33rd IEEE International Symposium on Industrial Electronics, ISIE 2024, Ulsan, Republic of Korea, June 18-21, 2024. pages 1-6, IEEE, 2024. [doi]

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