High Fidelity Measurement of Disk I/O Response Time Using Standard AIX Monitoring Tools - researchr publication authors

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John R. Zaleski, Keith E. Silliman. High Fidelity Measurement of Disk I/O Response Time Using Standard AIX Monitoring Tools. In 23rd International Computer Measurement Group Conference, December 7-12, 1997, Orlando, Florida, USA, Proceedings. pages 391-398, Computer Measurement Group, 1997.

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