John R. Zaleski, Keith E. Silliman. High Fidelity Measurement of Disk I/O Response Time Using Standard AIX Monitoring Tools. In 23rd International Computer Measurement Group Conference, December 7-12, 1997, Orlando, Florida, USA, Proceedings. pages 391-398, Computer Measurement Group, 1997.
@inproceedings{ZaleskiS97,
title = {High Fidelity Measurement of Disk I/O Response Time Using Standard AIX Monitoring Tools},
author = {John R. Zaleski and Keith E. Silliman},
year = {1997},
tags = {e-science},
researchr = {https://researchr.org/publication/ZaleskiS97},
cites = {0},
citedby = {0},
pages = {391-398},
booktitle = {23rd International Computer Measurement Group Conference, December 7-12, 1997, Orlando, Florida, USA, Proceedings},
publisher = {Computer Measurement Group},
}