Sebastian Zambal, Christian Eitzinger, Michael Clarke, John Klintworth, Pierre-Yves Mechin. A digital twin for composite parts manufacturing : Effects of defects analysis based on manufacturing data. In 16th IEEE International Conference on Industrial Informatics, INDIN 2018, Porto, Portugal, July 18-20, 2018. pages 803-808, IEEE, 2018. [doi]
@inproceedings{ZambalECKM18,
title = {A digital twin for composite parts manufacturing : Effects of defects analysis based on manufacturing data},
author = {Sebastian Zambal and Christian Eitzinger and Michael Clarke and John Klintworth and Pierre-Yves Mechin},
year = {2018},
doi = {10.1109/INDIN.2018.8472014},
url = {https://doi.org/10.1109/INDIN.2018.8472014},
researchr = {https://researchr.org/publication/ZambalECKM18},
cites = {0},
citedby = {0},
pages = {803-808},
booktitle = {16th IEEE International Conference on Industrial Informatics, INDIN 2018, Porto, Portugal, July 18-20, 2018},
publisher = {IEEE},
isbn = {978-1-5386-4829-2},
}