A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories - researchr publication authors

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C. Zambelli, Marco Indaco, Michele Fabiano, Stefano Di Carlo, Paolo Prinetto, Piero Olivo, D. Bertozzi. A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories. In Wolfgang Rosenstiel, Lothar Thiele, editors, 2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012. pages 881-886, IEEE, 2012. [doi]

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