C. Zambelli, Marco Indaco, Michele Fabiano, Stefano Di Carlo, Paolo Prinetto, Piero Olivo, D. Bertozzi. A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories. In Wolfgang Rosenstiel, Lothar Thiele, editors, 2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012. pages 881-886, IEEE, 2012. [doi]
@inproceedings{ZambelliIFCPOB12,
title = {A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories},
author = {C. Zambelli and Marco Indaco and Michele Fabiano and Stefano Di Carlo and Paolo Prinetto and Piero Olivo and D. Bertozzi},
year = {2012},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=6176622},
researchr = {https://researchr.org/publication/ZambelliIFCPOB12},
cites = {0},
citedby = {0},
pages = {881-886},
booktitle = {2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012},
editor = {Wolfgang Rosenstiel and Lothar Thiele},
publisher = {IEEE},
isbn = {978-1-4577-2145-8},
}