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Investigating Algorithmic Bias on Bayesian Knowledge Tracing and Carelessness Detectors

Andres Felipe Zambrano, Jiayi Zhang, Ryan S. Baker 0001. Investigating Algorithmic Bias on Bayesian Knowledge Tracing and Carelessness Detectors. In Proceedings of the 14th Learning Analytics and Knowledge Conference, LAK 2024, Kyoto, Japan, March 18-22, 2024. pages 349-359, ACM, 2024. [doi]

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