Iliya Zamek, Steve Zamek. Jitter transformations in measurement instruments and discrepancies between measurement results. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 10, IEEE, 2005. [doi]
@inproceedings{ZamekZ05a, title = {Jitter transformations in measurement instruments and discrepancies between measurement results}, author = {Iliya Zamek and Steve Zamek}, year = {2005}, doi = {10.1109/TEST.2005.1583960}, url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1583960}, researchr = {https://researchr.org/publication/ZamekZ05a}, cites = {0}, citedby = {0}, pages = {10}, booktitle = {Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005}, publisher = {IEEE}, isbn = {0-7803-9038-5}, }