From BDD Scenarios to Test Case Generation

Tannaz Zameni, Petra van den Bos, Jan Tretmans, Johan Foederer, Arend Rensink. From BDD Scenarios to Test Case Generation. In IEEE International Conference on Software Testing, Verification and Validation, ICST 2023 - Workshops, Dublin, Ireland, April 16-20, 2023. pages 36-44, IEEE, 2023. [doi]

Abstract

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