WearMon: Reliability monitoring using adaptive critical path testing

Bardia Zandian, Waleed Dweik, Suk Hun Kang, Thomas Punihaole, Murali Annavaram. WearMon: Reliability monitoring using adaptive critical path testing. In Proceedings of the 2010 IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2010, Chicago, IL, USA, June 28 - July 1 2010. pages 151-160, IEEE, 2010. [doi]

Abstract

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