Cost Effective Adaptive Voltage Scaling Using Path Delay Fault Testing - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars. Cost Effective Adaptive Voltage Scaling Using Path Delay Fault Testing. In 2018 IEEE East-West Design & Test Symposium, EWDTS 2018, Kazan, Russia, September 14-17, 2018. pages 1-6, IEEE, 2018. [doi]

This author has not been identified. Look up 'Mahroo Zandrahimi' in GoogleThis author has not been identified. Look up 'Philippe Debaud' in GoogleThis author has not been identified. Look up 'Armand Castillejo' in GoogleThis author has not been identified. Look up 'Zaid Al-Ars' in Google

runs on WebDSL