Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars. Cost Effective Adaptive Voltage Scaling Using Path Delay Fault Testing. In 2018 IEEE East-West Design & Test Symposium, EWDTS 2018, Kazan, Russia, September 14-17, 2018. pages 1-6, IEEE, 2018. [doi]
Abstract is missing.