Zhiqiang Zang, Aditya Thimmaiah, Milos Gligoric 0001. Pattern-Based Peephole Optimizations with Java JIT Tests. In René Just, Gordon Fraser 0001, editors, Proceedings of the 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2023, Seattle, WA, USA, July 17-21, 2023. pages 64-75, ACM, 2023. [doi]
Abstract is missing.