Janusz Zarebski, Krzysztof Górecki, Jacek Dabrowski. Measuring system for determining thermal parameters of semiconductor devices. In Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2013, Gdynia, Poland, June 20-22, 2013. pages 316-320, IEEE, 2013. [doi]
Abstract is missing.