An Efficient Fault Diagnosis Framework for Digital Twins Using Optimized Machine Learning Models in Smart Industrial Control Systems

Samar M. Zayed, Gamal Attiya, Ayman El-Sayed, Amged Sayed, Ezz El-Din Hemdan. An Efficient Fault Diagnosis Framework for Digital Twins Using Optimized Machine Learning Models in Smart Industrial Control Systems. Int. J. Computational Intelligence Systems, 16(1):69, December 2023. [doi]

Abstract

Abstract is missing.