Nikolaos Zazatis, Alessandro Veronesi, Konstantinos Varakliotis, Pelopidas Tsoumanis, Christos P. Sotiriou, Letícia Maria Bolzani Pöhls, Marko S. Andjelkovic, Davide Bertozzi. Cross-Layer Reliability Analysis of Slimmable Neural Networks under Permanent Faults. In 44th IEEE VLSI Test Symposium, VTS 2026, Napa, CA, USA, April 27-29, 2026. pages 1-5, IEEE, 2026. [doi]
Abstract is missing.