External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Determination of the ESD Failure Cause Through its Signature

M. Zecri, P. Besse, P. Givelin, M. Nayrolles, M. Bafleur, N. Nolhier. Determination of the ESD Failure Cause Through its Signature. Microelectronics Reliability, 43(9-11):1551-1556, 2003. [doi]

Authors

M. Zecri

This author has not been identified. Look up 'M. Zecri' in Google

P. Besse

This author has not been identified. Look up 'P. Besse' in Google

P. Givelin

This author has not been identified. Look up 'P. Givelin' in Google

M. Nayrolles

This author has not been identified. Look up 'M. Nayrolles' in Google

M. Bafleur

This author has not been identified. Look up 'M. Bafleur' in Google

N. Nolhier

This author has not been identified. Look up 'N. Nolhier' in Google
runs on