Determination of the ESD Failure Cause Through its Signature

M. Zecri, P. Besse, P. Givelin, M. Nayrolles, M. Bafleur, N. Nolhier. Determination of the ESD Failure Cause Through its Signature. Microelectronics Reliability, 43(9-11):1551-1556, 2003. [doi]

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