Grid-Based Likelihood Ratio Classifiers for the Comparison of Facial Marks

Chris G. Zeinstra, Raymond N. J. Veldhuis, Luuk J. Spreeuwers. Grid-Based Likelihood Ratio Classifiers for the Comparison of Facial Marks. IEEE Transactions on Information Forensics and Security, 13(1):253-264, 2018. [doi]

Abstract

Abstract is missing.