Vesna Zeljkovic, Claude Tameze, Darrin J. Pochan, Yingchao Chen, Ventzeslav Valev. Automated nanostructure microscopic image characterization and analysis. In 2015 International Conference on High Performance Computing & Simulation, HPCS 2015, Amsterdam, Netherlands, July 20-24, 2015. pages 290-297, IEEE, 2015. [doi]
Abstract is missing.