A Hierarchical Learning-Based Approach for the Automatic Defect Detection and Classification of AFP Process Using Thermography - researchr publication

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Muhammed Zemzemoglu, Mustafa Unel. A Hierarchical Learning-Based Approach for the Automatic Defect Detection and Classification of AFP Process Using Thermography. In 49th Annual Conference of the IEEE Industrial Electronics Society, IECON 2023, Singapore, October 16-19, 2023. pages 1-6, IEEE, 2023. [doi]

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