Complete Reconfigurable Boolean Logic Gates Based on One FeFET -One RRAM Technology

Yiqin Zeng, Zhetao Ding, Xueyang Li, Minglei Ma, Yue Peng, Rongzong Shen, Gaobo Lin, Chengji Jin, Xiao Yu, Bing Chen, Ran Cheng, Genquan Han. Complete Reconfigurable Boolean Logic Gates Based on One FeFET -One RRAM Technology. In 53rd IEEE European Solid-State Device Research Conference, ESSDERC 2023, Lisbon, Portugal, September 11-14, 2023. pages 85-88, IEEE, 2023. [doi]

@inproceedings{ZengDLMPSLJYCCH23,
  title = {Complete Reconfigurable Boolean Logic Gates Based on One FeFET -One RRAM Technology},
  author = {Yiqin Zeng and Zhetao Ding and Xueyang Li and Minglei Ma and Yue Peng and Rongzong Shen and Gaobo Lin and Chengji Jin and Xiao Yu and Bing Chen and Ran Cheng and Genquan Han},
  year = {2023},
  doi = {10.1109/ESSDERC59256.2023.10268548},
  url = {https://doi.org/10.1109/ESSDERC59256.2023.10268548},
  researchr = {https://researchr.org/publication/ZengDLMPSLJYCCH23},
  cites = {0},
  citedby = {0},
  pages = {85-88},
  booktitle = {53rd IEEE European Solid-State Device Research Conference, ESSDERC 2023, Lisbon, Portugal, September 11-14, 2023},
  publisher = {IEEE},
  isbn = {979-8-3503-0423-7},
}