Jie Zeng, Shurong Dong, Lei Zhong, Guo Wei, Yan Han, Weicheng Liu, Hongwei Li, Jun Wang. An area-efficient LDMOS-SCR ESD protection device for the I/O of power IC application. Microelectronics Reliability, 54(6-7):1173-1178, 2014. [doi]
@article{ZengDZWHLLW14,
title = {An area-efficient LDMOS-SCR ESD protection device for the I/O of power IC application},
author = {Jie Zeng and Shurong Dong and Lei Zhong and Guo Wei and Yan Han and Weicheng Liu and Hongwei Li and Jun Wang},
year = {2014},
doi = {10.1016/j.microrel.2013.12.004},
url = {http://dx.doi.org/10.1016/j.microrel.2013.12.004},
researchr = {https://researchr.org/publication/ZengDZWHLLW14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {6-7},
pages = {1173-1178},
}