Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Jie Zeng, Shurong Dong, Lei Zhong, Guo Wei, Yan Han, Weicheng Liu, Hongwei Li, Jun Wang. An area-efficient LDMOS-SCR ESD protection device for the I/O of power IC application. Microelectronics Reliability, 54(6-7):1173-1178, 2014. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Comparative study of reliability degradation behaviors of LDMOS and LDMOS-SCR ESD protection devicesZhihui Yu, Hao Jin, Shurong Dong, Hei Wong, Jie Zeng, Weihuai Wang. mr, 61:111-114, 2016. [doi]
The following publications are possibly variants of this publication: