Gang Zeng, Hideo Ito. Concurrent core test for SOC using shared test set and scan chain disable. In Georges G. E. Gielen, editor, Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006. pages 1045-1050, European Design and Automation Association, Leuven, Belgium, 2006. [doi]
Abstract is missing.