Research on Test Suite Reduction Using Attribute Relevance Analysis

Fanping Zeng, Ling Li, Juan Li, Xufa Wang. Research on Test Suite Reduction Using Attribute Relevance Analysis. In Huaikou Miao, Gongzhu Hu, editors, 8th IEEE/ACIS International Conference on Computer and Information Science, IEEE/ACIS ICIS 2009, June 1-3, 2009, Shanghai, China. pages 961-966, IEEE Computer Society, 2009. [doi]

Abstract

Abstract is missing.